Hidaka, Japan

Hiroshi Takayanagi


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Hiroshi Takayanagi: Innovator in Semiconductor Memory Technology.

Introduction

Hiroshi Takayanagi is a notable inventor based in Hidaka, Japan. He has made significant contributions to the field of semiconductor memory technology. His work focuses on enhancing the reliability of storage systems, particularly in the context of soft errors.

Latest Patents

Hiroshi Takayanagi holds a patent for an "Error detection and correction circuit and semiconductor memory." This invention involves a method where input data, having an integral multiple of 8 bits, is divided into symbols in units of b bits, where b is an integer between 5 and 7. An error detecting code is added in an error detection calculation circuit, followed by encoding, such as Reed Solomon (RS) encoding, which has an error correction capability of two or more symbols. This process ensures that data is recorded in a storage system. During reproduction, error correction is performed in units of symbols to retrieve data from storage, followed by error detection processing. This innovative approach allows for the recovery of data in an integral multiple of 8 bits, thereby providing a highly reliable storage system against soft errors that can occur in semiconductor memory.

Career Highlights

Hiroshi Takayanagi is associated with Hitachi Ulsi Systems Co., Ltd., where he has contributed to various projects aimed at improving semiconductor technologies. His expertise in error detection and correction circuits has positioned him as a key figure in the development of reliable memory systems.

Collaborations

Hiroshi has worked alongside Morishi Izumita, contributing to advancements in semiconductor technology and enhancing the capabilities of storage systems.

Conclusion

Hiroshi Takayanagi's innovative work in semiconductor memory technology, particularly in error detection and correction, has made a significant impact on the reliability of storage systems. His contributions continue to influence the field and pave the way for future advancements.

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