Location History:
- Itami, JP (1998)
- Tokyo, JP (2004)
Company Filing History:
Years Active: 1998-2004
Title: Hiroomi Nakao: Innovator in Data Receiving Technology
Introduction
Hiroomi Nakao is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of data receiving technology, holding a total of 2 patents. His work focuses on enhancing the efficiency and accuracy of data transmission systems.
Latest Patents
Nakao's latest patents include a "Data receiving device for receiving serial data according to over-sampling." This invention involves sampling each input binary digit of an input serial bit string multiple times to produce over-sampled binary digits. The method ensures that the word start position of a referential word is detected with high probability, allowing for accurate data retrieval. Another notable patent is the "Charged beam pattern data generating method and a charged beam pattern." This method generates high-quality pattern data from circuit layout design data for semiconductor devices, which is crucial for the production of resist patterns in semiconductor manufacturing processes.
Career Highlights
Hiroomi Nakao is associated with Mitsubishi Electric Corporation, where he applies his expertise in data technology. His innovative approaches have contributed to advancements in the semiconductor industry, particularly in data transmission and pattern generation.
Collaborations
Nakao has collaborated with notable colleagues such as Koichi Moriizumi and Kinya Kamiyama. Their combined efforts have led to significant developments in their respective fields.
Conclusion
Hiroomi Nakao's contributions to data receiving technology and semiconductor manufacturing highlight his role as an influential inventor. His patents reflect a commitment to innovation and excellence in technology.