Hiromi Kojima

Title: Hiromi Kojima: Innovator in Semiconductor Testing

Introduction

Hiromi Kojima is a prominent inventor based in Chiba, Japan. She has made significant contributions to the field of semiconductor technology, particularly in the area of testing integrated circuits. Her innovative approach has led to the development of methods that enhance the efficiency of detecting faults in semiconductor devices.

Latest Patents

Hiromi Kojima holds a patent for a "Method of generating test condition for detecting delay faults in semiconductor integrated circuit and apparatus for generating the same." This patent outlines various exemplary embodiments that provide methods and apparatuses for generating test conditions that efficiently detect delay faults while preventing overkill. According to the exemplary embodiment, a test timing correcting block sets test timing faster than the actual operation timing of a logical circuit to be tested. Additionally, a logical simulation block performs simulation using delay times of signal paths corrected by adding a minimum slack margin. When the simulation indicates that an end-side flip-flop cannot acquire data after an expected transition of logical value, a masking block generates mask data that masks data held in the end-side flip-flop.

Career Highlights

Hiromi Kojima is currently employed at Kawasaki Microelectronics, Inc. Her work at this company has been instrumental in advancing semiconductor testing methodologies. She has dedicated her career to improving the reliability and performance of integrated circuits through innovative testing solutions.

Collaborations

Due to space constraints, the collaborations section has been omitted.

Conclusion

Hiromi Kojima's contributions to semiconductor testing exemplify her innovative spirit and dedication to advancing technology. Her patent reflects her expertise and commitment to enhancing the efficiency of fault detection in integrated circuits.