Taito-ku, Japan

Hiroki Unten

USPTO Granted Patents = 3 


Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2017-2019

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3 patents (USPTO):Explore Patents

Title: Hiroki Unten: Innovator in Three-Dimensional Shape Measurement

Introduction

Hiroki Unten is a notable inventor based in Taito-ku, Japan. He has made significant contributions to the field of three-dimensional shape measurement, holding a total of three patents. His work focuses on developing advanced technologies that enhance the accuracy and efficiency of shape measurement processes.

Latest Patents

Hiroki Unten's latest patents include an "Apparatus for measuring three-dimensional shape," a "Method for measuring three-dimensional shape," and a "Three-dimensional shape measurement program." The three-dimensional shape measurement apparatus features an imaging unit that successively outputs two-dimensional images. It also includes a memory unit for storing these images, a three-dimensional shape model generation unit that creates a model based on the images, and a region calculation unit that identifies measurement-completed regions. Additionally, a display image generation unit produces display images based on the processed data. Another patent involves an image processing device that acquires multiple images of an object from various angles, calculates image quality, determines measurement processes based on this quality, and executes the necessary procedures.

Career Highlights

Hiroki Unten is currently employed at Toppan Printing Co., Ltd., where he continues to innovate in the field of image processing and three-dimensional measurement technologies. His work has been instrumental in advancing the capabilities of measurement systems, making them more reliable and user-friendly.

Collaborations

Hiroki collaborates with Tatsuya Ishii, a fellow innovator, to further enhance their research and development efforts in the field of image processing and measurement technologies.

Conclusion

Hiroki Unten's contributions to three-dimensional shape measurement and image processing demonstrate his commitment to innovation and excellence in technology. His patents reflect a deep understanding of the complexities involved in accurate measurement, positioning him as a key figure in his field.

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