Company Filing History:
Years Active: 2025
Title: Hiroki Takada: Innovator in Measurement Processing Technology
Introduction
Hiroki Takada is a prominent inventor based in Saga-shi, Saga, Japan. He has made significant contributions to the field of measurement processing technology. His innovative approach has led to the development of a unique device that enhances the accuracy of spatial measurements.
Latest Patents
Hiroki Takada holds a patent for a "Measurement processing device, method, and program." This invention aims to accurately replace position coordinates in a virtual space, which is composed of three-dimensional data, with latitude, longitude, and altitude information from the real world. The device utilizes a camera unit to image a real space and superimposes a virtual space that indicates the imaged real space using three-dimensional data. It displays the superimposed spaces and acquires measurement points from a position-measuring device that records latitude, longitude, and altitude. The device images the position-measuring device, associates the virtual space coordinates with the real space coordinates, and transforms the three-dimensional data coordinates to match the real space coordinates using a predetermined transformation equation. Hiroki Takada has 1 patent to his name.
Career Highlights
Hiroki Takada is currently employed at Optim Corporation, where he continues to innovate and develop advanced measurement processing technologies. His work has been instrumental in bridging the gap between virtual and real spaces, enhancing the accuracy of spatial data representation.
Collaborations
Hiroki collaborates with notable colleagues, including Tetsugo Matsuo and Nobuya Nishimoto. Their combined expertise contributes to the advancement of measurement processing technologies.
Conclusion
Hiroki Takada's contributions to measurement processing technology exemplify the impact of innovative thinking in the field. His patent and ongoing work at Optim Corporation highlight his commitment to enhancing spatial measurement accuracy.