Location History:
- Takatsuki, JP (2009)
- Suita, JP (2011 - 2014)
Company Filing History:
4 out of 21 
3 out of 989 
1 out of 832,912 Years Active: 2009-2014
Title: Innovations of Hidekazu Mimura
Introduction
Hidekazu Mimura is a prominent inventor based in Suita, Japan. He has made significant contributions to the field of X-ray technology, holding a total of four patents. His work focuses on enhancing the precision and efficiency of X-ray measurements and optical elements.
Latest Patents
Mimura's latest patents include a "Method and apparatus of precisely measuring intensity profile of X-ray nanobeam." This invention provides a method and apparatus for accurately measuring the intensity profile of an X-ray nanobeam. It allows for the measurement of X-rays with different wavelengths using a single knife edge, optimizing measurements based on the depth of focus and other device conditions. The knife edge is crafted from heavy metal to advance the phase of the X-ray passing through it, enabling precise measurements through a dark field measurement method.
Another notable patent is the "High precision posture control method of X-ray mirror." This method sustains the posture of an X-ray optical element at a constant precision of 1 µrad or less. It involves a K-B mirror arrangement with longitudinal and lateral condensation mirrors, each featuring elliptical reflective surfaces. The method includes monitoring interference fringes to provide feedback for posture control, ensuring high precision in X-ray applications.
Career Highlights
Throughout his career, Hidekazu Mimura has worked with notable organizations such as Jtec Corporation and Osaka University. His experience in these institutions has allowed him to develop and refine his innovative technologies in X-ray measurement and optical systems.
Collaborations
Mimura has collaborated with esteemed colleagues, including Kazuto Yamauchi and Hiromi Okada. Their joint efforts have contributed to advancements in the field of X-ray technology.
Conclusion
Hidekazu Mimura's contributions to X-ray technology through his innovative patents and collaborations highlight his significant role in advancing precision measurement techniques. His work continues to influence the field and inspire future innovations.