Seoul, South Korea

Heui-Jae Pahk



Average Co-Inventor Count = 2.8

ph-index = 2

Forward Citations = 23(Granted Patents)


Location History:

  • Bongchun-dong, Kwanak-ku, Seoul, KR (2007)
  • Seoul, KR (2005 - 2012)

Company Filing History:


Years Active: 2005-2012

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6 patents (USPTO):Explore Patents

Title: The Innovations of Heui-Jae Pahk: A Visionary in Thickness Measurement Technology

Introduction: Heui-Jae Pahk, an esteemed inventor based in Seoul, South Korea, has made significant contributions to the field of thickness measurement technology. With a total of six patents to his name, Pahk's work is recognized for its innovation and utility in various applications.

Latest Patents: Pahk's most recent patents include a groundbreaking method for measuring thickness and an advanced apparatus for measuring thickness. The method involves utilizing an interferometer to ascertain the thickness of a subjecting layer bonded to a base layer. This technique entails several steps, such as deriving a correlation equation based on phase differences in sample layers, gathering interference signals at different boundary surfaces, and ultimately determining the thickness through intricate calculations.

The thickness measurement apparatus designed by Pahk features a beam splitter, multiple lens components, and detectors that work in tandem to accurately gauge the thickness of an object. These innovations reflect his commitment to advancing measurement techniques and enhancing precision in various industrial contexts.

Career Highlights: Heui-Jae Pahk's career is marked by his tenure at notable companies, including SNU Precision Co., Ltd. His expertise in optical measurement technologies has established him as a leading figure in this niche, enabling him to develop groundbreaking solutions that address the challenges of thickness measurement.

Collaborations: Throughout his career, Pahk has engaged in collaborations with esteemed colleagues such as Jong-Ho Park and Young-Min Hwang. These partnerships have fostered an environment of innovation, allowing for the exchange of ideas and expertise that have driven forward the advancements in thickness measurement technologies.

Conclusion: Heui-Jae Pahk stands as a prominent inventor in the realm of optical measurement. With his innovative patents and successful collaborations, he continues to push the boundaries of technology, providing new solutions and advancing industry standards. His work not only highlights his capability as an inventor but also underscores the importance of innovation in transforming complex measurement challenges into practical solutions.

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