Milpitas, CA, United States of America

Henry Fu


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2020

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Innovator Spotlight: Henry Fu from Milpitas, CA

Introduction: In the landscape of modern technology, inventors like Henry Fu are pivotal to advancements in integrated circuits and memory testing. Residing in Milpitas, California, Henry has made notable contributions through his innovative approach to memory test configurations.

Latest Patents: Henry Fu holds a patent for a "Built-in Configuration Memory Test." This groundbreaking invention outlines a self-test process where an integrated circuit incorporates a test controller. The test controller efficiently tests multiple frames within the circuit's memory. It replicates and stores a test pattern in each frame, accommodating the variability in frame sizes, which may lead to partial test pattern storage. The controller further reads the stored data to generate a checksum, allowing a comparison against a baseline checksum from simulated design code. This vital process is essential for identifying manufacturing defects within the frames.

Career Highlights: Henry Fu has established himself as a valuable member of Xilinx, Inc., where he contributes to cutting-edge innovations in electronics. His work focuses on developing solutions that enhance the reliability and performance of integrated circuits.

Collaborations: At Xilinx, Henry collaborates with talented individuals like Weiguang Lu and Karthy Rajasekharan. Together, they harness their expertise to push the boundaries of technology, ensuring that products meet rigorous standards for quality and efficiency.

Conclusion: Henry Fu's contributions to the field of integrated circuits and memory testing highlight the significance of innovation within technology companies. His patent on built-in configuration memory testing not only showcases his ingenuity but also serves as an important tool for identifying manufacturing defects, ultimately leading to more reliable electronic products.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…