Henry B Taylor, Iii

Title: Henry B. Taylor III: Innovator in Semiconductor Technology

Introduction

Henry B. Taylor III is a notable inventor based in San Antonio, TX (US). He has made significant contributions to the field of semiconductor technology, particularly in the area of defect monitoring. His innovative approach has led to advancements that enhance the quality and reliability of semiconductor wafers.

Latest Patents

Henry B. Taylor III holds a patent for a method and apparatus for detecting the presence of selected types of defects on a non-visible chosen surface of a semiconductor wafer. This invention addresses issues such as chemical stains from liquid photoresist materials or liquid dielectric materials. The patent outlines a process where a support substrate with a highly reflecting surface is used to illuminate the chosen surface, allowing for the examination of optical images to identify defects. This method significantly improves the detection of defects that may affect semiconductor performance.

Career Highlights

Henry B. Taylor III is currently employed at VLSI Technology, Inc., where he continues to work on innovative solutions in semiconductor technology. His expertise and dedication to research have positioned him as a valuable asset in the industry.

Collaborations

Henry has collaborated with notable colleagues, including Anthony Sayka and Stacy W. Hall. Their combined efforts contribute to the advancement of semiconductor technologies and the development of new methodologies.

Conclusion

Henry B. Taylor III is a distinguished inventor whose work in semiconductor defect monitoring has made a significant impact on the industry. His innovative patent and collaboration with talented colleagues highlight his commitment to advancing technology in this critical field.