Pfaffhausen, Switzerland

Heinz Maeder


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 13(Granted Patents)


Company Filing History:


Years Active: 1987

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1 patent (USPTO):Explore Patents

Title: Heinz Maeder: Innovator in Projectile Measurement Technology

Introduction

Heinz Maeder is a notable inventor based in Pfaffhausen, Switzerland. He is recognized for his contributions to the field of projectile measurement technology. His innovative approach has led to the development of a unique apparatus that enhances the accuracy of measuring muzzle velocity.

Latest Patents

Heinz Maeder holds a patent for an "Apparatus for measuring the muzzle velocity of a projectile fired from a weapon." This apparatus is designed to eliminate the effects of interfering magnetic fields, particularly the terrestrial magnetic field. It features a shielding arrangement that effectively screens these magnetic interferences. The apparatus includes two induction coils and a support made from a material with low magnetic permeability. Additionally, it is constructed as a muzzle brake, making it suitable for measuring the muzzle velocity of sabot projectiles. Maeder's patent represents a significant advancement in the field of projectile measurement.

Career Highlights

Heinz Maeder has made significant strides in his career, particularly through his work at Werkzeugmaschinenfabrik Oerlikon-Buhrle AG. His expertise in engineering and innovation has positioned him as a key figure in the development of advanced measurement technologies.

Collaborations

Heinz Maeder has collaborated with notable colleagues, including Godwin Ettel and Robert Ramseyer. These partnerships have contributed to the successful development and implementation of innovative technologies in their respective fields.

Conclusion

Heinz Maeder's contributions to the field of projectile measurement technology highlight his innovative spirit and dedication to engineering excellence. His patented apparatus not only advances measurement accuracy but also showcases the importance of addressing external interferences in technological applications.

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