Company Filing History:
Years Active: 1988-1991
Title: Heiner Otten: Innovator in Texture Analysis and Thickness Measurement
Introduction
Heiner Otten is a notable inventor based in Dortmund, Germany. He has made significant contributions to the field of material analysis, particularly in the texture analysis of rolled metal sheets and strips. With a total of 2 patents, Otten's work has advanced the methodologies used in industrial applications.
Latest Patents
Otten's latest patents include a "Method and apparatus for texture analysis" and an "Apparatus for measuring the thickness profile of rolled strips." The first patent focuses on analyzing the texture of rolled metal sheets and strips using X-rays or gamma rays. This method involves dividing the total beam emitted by the radiation source into several component beams, each aimed at different angles on the tested area. The diffracted radiation is then analyzed based on its energy distribution, with results processed by a computer. The second patent addresses the measurement of the thickness profile of rolled metal sheets by utilizing a slit diaphragm that rotates around the center axis of the X-ray tube. This innovative approach allows for precise measurements of thickness through the absorption of X-rays.
Career Highlights
Heiner Otten is associated with Hoesch Stahl Aktiengesellschaft, a company known for its expertise in steel production and processing. His work at the company has been instrumental in developing advanced techniques for material analysis, enhancing the quality and efficiency of metal processing.
Collaborations
Otten has collaborated with notable colleagues such as Hermann J Kopineck and Hans-Joachim Bunge. Their combined expertise has contributed to the successful development of innovative technologies in the field.
Conclusion
Heiner Otten's contributions to the field of material analysis through his patents and collaborations highlight his role as a key innovator. His work continues to influence the industry, paving the way for advancements in texture analysis and thickness measurement.