Company Filing History:
Years Active: 2010
Title: Hee Ok Jang - Innovator in Scanning Probe Microscopy
Introduction
Hee Ok Jang is a notable inventor based in Seoul, South Korea. He has made significant contributions to the field of microscopy, particularly through his innovative methods in fabricating probes for scanning probe microscopes. His work has implications for various scientific and industrial applications.
Latest Patents
Hee Ok Jang holds a patent for a "Method for fabricating probe for use in scanning probe microscope." This patent describes a method that includes forming a triangular prism with a passivation film by patterning a {111} general silicon wafer. The process involves etching the silicon wafer to create a probe tip in the shape of a triangular pyramid and subsequently removing the passivation film. This innovation enhances the functionality and precision of scanning probe microscopes.
Career Highlights
Hee Ok Jang is associated with M2N Inc., where he continues to develop and refine his inventions. His expertise in materials science and engineering has positioned him as a key figure in advancing microscopy technologies.
Collaborations
Hee Ok Jang collaborates with Young Geun Park, who is also a talented professional in the field. Their partnership exemplifies the importance of teamwork in driving innovation and achieving breakthroughs in technology.
Conclusion
Hee Ok Jang's contributions to the field of scanning probe microscopy through his patented methods demonstrate his commitment to advancing scientific research. His work not only enhances the capabilities of microscopy but also paves the way for future innovations in the field.