Harry Wayne Harris is a notable inventor based in Hamlin, NY (US). He has made significant contributions to the field of material measurement technology. With a total of 5 patents to his name, Harris has developed innovative solutions that enhance the accuracy and efficiency of measuring material thickness profiles.

Latest Patents

Harris's latest patents include an "Apparatus for measuring material thickness profiles" and a "Method for measuring material thickness profiles." The apparatus is designed to determine the thickness profile of a moving material with at least two optical interfaces. It features a transport apparatus that maintains the material at a predetermined flatness while passing through a measurement region. The recessed track in the channel allows for non-contact measurement, while the interferometer apparatus collects light reflected from the optical interfaces to generate an interference signal. This signal is then analyzed to determine the thickness profile of the material.

The method for measuring material thickness profiles involves transporting a length of material at a constant velocity through a measurement region. A beam of light is directed toward the moving material, and the reflected light is collected and analyzed by the interferometer apparatus. This process allows for precise determination of the thickness profile in the first direction.

Career Highlights

Harry Wayne Harris is currently associated with Eastman Kodak Company, where he continues to innovate in the field of material measurement. His work has contributed to advancements in technology that are essential for various industrial applications.

Collaborations

Harris has collaborated with notable coworkers such as James R. Schaeffer and Roy Eugene Snoke. Their combined expertise has fostered a creative environment that encourages innovation and the development of cutting-edge technologies.

Conclusion

Harry Wayne Harris is a distinguished inventor whose work in measuring material thickness profiles has made a significant impact in the industry. His patents reflect a commitment to advancing technology and improving measurement accuracy.

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