Hao Zhang

Title: Innovation Spotlight: Inventor Hao Zhang Revolutionizing Measurement Systems

Introduction:

Hao Zhang, a brilliant inventor based in Amsterdam, NL, has made significant contributions to the field of measurement systems. With a total of 2 patents under his belt, his groundbreaking work is setting new standards in the industry.

Latest Patents:

1. Alignment Measurement System:

Hao Zhang's latest patent introduces a method for determining the characteristics of features in objects that are situated below the object's surface. By irradiating the surface with a pulsed pump radiation beam to generate an acoustic wave and then using a measurement radiation beam, a feature's characteristic is accurately determined within a measurement time period. The innovative use of temporal intensity distribution enhances the signal to background ratio, offering superior results compared to conventional methods.

2. Method and Apparatus for Measuring a Structure on a Substrate:

In his second patent, Zhang addresses the challenges in detecting alignment marks accurately on substrates with multiple layers of specific materials. By illuminating the substrate with excitation radiation and measuring the effects associated with reflected materials scattered by buried structures, he derives crucial characteristics of the structure. This approach provides a robust solution for applications like lithographic apparatus.

Career Highlights:

Hao Zhang is affiliated with ASML Netherlands B.V., a leading company in the technology industry. His contributions to the company's research and development efforts have been instrumental in driving innovation and advancing measurement technologies.

Collaborations:

Zhang has collaborated with esteemed colleagues such as Stefan Michiel Witte and Alessandro Antoncecchi. Through shared expertise and innovative thinking, their collaborations have enriched the field of measurement systems and expanded the boundaries of technological possibilities.

Conclusion:

Inventor Hao Zhang's dedication to pushing the boundaries of measurement technologies is evident in his novel patents and collaborations. His work not only showcases his creativity and expertise but also highlights the importance of innovation in driving progress in the scientific community. Zhang's contributions are shaping the future of measurement systems and paving the way for new breakthroughs in the industry.