Hao Jiang

Title: Hao Jiang - Innovator in X-ray Detection Technology

Introduction

Hao Jiang is a notable inventor based in Madison, WI (US), recognized for his contributions to the field of X-ray detection technology. With a focus on developing advanced analytical tools, Jiang has made significant strides in enhancing the capabilities of X-ray detectors.

Latest Patents

Hao Jiang holds a patent for an "Indirect photon-counting analytical X-ray detector." This innovative device is designed to detect low-energy X-rays and features a scintillator screen that is directly coupled to a two-dimensional optical sensor. The detector employs a signal filter to eliminate high-intensity signal contributions that may arise from direct interactions between the X-ray signal and the optical sensor. The scintillator screen is engineered to ensure high absorption of incident X-ray photons, utilizing phosphor grains with a relatively small grain size. Additionally, a cooling apparatus may be integrated to maintain the optical sensor's temperature, enhancing its performance.

Career Highlights

Throughout his career, Hao Jiang has worked with various companies, including Bruker AXS GmbH, where he has contributed to the development of cutting-edge technologies in the field of analytical instrumentation. His work has been pivotal in advancing the capabilities of X-ray detection systems.

Collaborations

Hao Jiang has collaborated with notable professionals in his field, including Joerg Kaercher and Roger David Durst. These collaborations have further enriched his research and development efforts, leading to innovative solutions in X-ray detection technology.

Conclusion

Hao Jiang's contributions to the field of X-ray detection technology exemplify his commitment to innovation and excellence. His patent for an indirect photon-counting analytical X-ray detector showcases his ability to address complex challenges in analytical instrumentation.