Company Filing History:
Years Active: 2021
Title: The Innovations of Han-jik Nam
Introduction
Han-jik Nam is a prominent inventor based in Seoul, South Korea. He is known for his contributions to the field of probe card inspection technology. His innovative work has led to the development of advanced systems that enhance the efficiency and accuracy of probe card inspections.
Latest Patents
Han-jik Nam holds a patent for a "Probe card inspection wafer, probe card inspection system, and method of inspecting probe card." This patent includes a probe card inspection wafer that consists of a base wafer and first and second probe card inspection chips. These chips are strategically placed apart from each other on the base wafer. Each chip is divided into various inspection regions, including probe vertical-level and horizontal-position inspection regions, as well as contact inspection regions. The design incorporates first pad arrays for inspecting vertical levels of alternating-current probes and second pad arrays for inspecting vertical levels of VSS probes.
Career Highlights
Han-jik Nam is currently employed at Samsung Electronics Co., Ltd., where he continues to innovate and develop new technologies. His work has significantly impacted the field of semiconductor testing and inspection.
Collaborations
Some of his notable coworkers include Joon-su Ji and Dany Kim, who have collaborated with him on various projects within the company.
Conclusion
Han-jik Nam's contributions to probe card inspection technology exemplify the spirit of innovation in the semiconductor industry. His patented inventions are paving the way for more efficient testing methods, showcasing the importance of continuous advancement in technology.