Han Cui

Title: Han Cui - Innovator in Optical Microscopic Imaging

Introduction

Han Cui is a prominent inventor based in Beijing, China. He has made significant contributions to the field of optical microscopic imaging and spectral measurement. His innovative work has led to the development of advanced imaging techniques that enhance the capabilities of microscopic analysis.

Latest Patents

Han Cui holds a patent for a "Laser differential confocal mapping-spectrum microscopic imaging method and device." This invention combines differential confocal detection and spectrum detection techniques. It utilizes a dichroic beam splitting system to separate Rayleigh light for geometric position detection from Raman scattering light for spectrum detection. The method captures spectral information at the focus of the excitation spot with high spatial resolution, enabling detailed analysis of micro-areas in samples.

Career Highlights

Han Cui is affiliated with the Beijing Institute of Technology, where he continues to advance research in optical imaging technologies. His work has garnered attention for its innovative approach to enhancing imaging precision and accuracy.

Collaborations

Han Cui has collaborated with notable colleagues, including Weiqian Zhao and Lirong Qiu. These partnerships have contributed to the development and refinement of his patented technologies.

Conclusion

Han Cui's contributions to optical microscopic imaging represent a significant advancement in the field. His innovative methods and devices are poised to impact various applications in scientific research and analysis.