Company Filing History:
Years Active: 2012
Title: Hac Ju Lee: Innovator in Probe Tip Fabrication
Introduction
Hac Ju Lee is a notable inventor based in Chungcheongbuk-do, South Korea. He has made significant contributions to the field of probe tip fabrication, showcasing his innovative approach to solving technical challenges in this area.
Latest Patents
Hac Ju Lee holds a patent for a "Method for fabricating probe tip." This invention addresses the issue of surface size increase at the front end of the probe tip due to frequent contact with wafer chips. The method enhances the precision of the probe tip by involving a series of steps, including forming a front end on a silicon wafer, creating a patterned protective layer, and subsequently forming the body of the probe tip in the exposed area.
Career Highlights
Hac Ju Lee is associated with M2N Inc., where he applies his expertise in the development of advanced probe tips. His work has been instrumental in improving the efficiency and accuracy of semiconductor testing processes.
Collaborations
Hac Ju Lee collaborates with talented individuals such as Ki Pil Hong and Jong Hyeon Chae, contributing to a dynamic team focused on innovation in their field.
Conclusion
Hac Ju Lee's contributions to probe tip fabrication exemplify the impact of innovative thinking in technology. His patent reflects a commitment to enhancing precision in semiconductor applications, marking him as a significant figure in his industry.