Company Filing History:
Years Active: 2013-2017
Title: Guofan Jiang: Innovator in Semiconductor Testing Technologies
Introduction
Guofan Jiang is a prominent inventor based in Shanghai, China, known for his contributions to the field of semiconductor testing. With a total of four patents to his name, Jiang has made significant advancements in improving fault diagnosis for integrated circuits.
Latest Patents
Jiang's latest patents include innovative methods for modifying scan chains to enhance the testing of semiconductors. One of his notable patents is titled "Modifying a scan chain for improved fault diagnosis of integrated circuits." This invention involves a computer program product designed to implement a scan chain for testing semiconductors. It includes computer-readable storage media and program instructions that facilitate the adjustment of scan register pairs to improve dependency management. Another significant patent is the "Method of diagnosable scan chain," which outlines a systematic approach to adjusting scan chain structures to ensure accurate testing outcomes.
Career Highlights
Guofan Jiang is currently employed at International Business Machines Corporation (IBM), where he continues to develop innovative solutions in semiconductor technology. His work focuses on enhancing the reliability and efficiency of integrated circuits through advanced testing methodologies.
Collaborations
Jiang collaborates with talented colleagues, including Yang Liu and Liang Chen, who contribute to his research and development efforts in the field of semiconductor testing.
Conclusion
Guofan Jiang's work exemplifies the importance of innovation in the semiconductor industry. His patents and contributions significantly enhance the reliability of integrated circuits, showcasing his expertise and commitment to advancing technology.