Guangzhi Li

Title: **Guangzhi Li: Innovator in Substrate Damage Inspection Technology**

Introduction

Guangzhi Li is an esteemed inventor based in Beijing, China, known for his contributions to the field of display technology. With a focus on developing innovative solutions for substrate damage inspection, his work has significant implications for the manufacturing industry.

Latest Patents

Guangzhi Li holds a patent for his invention titled "Substrate damage inspection apparatus, production system and inspection method." This innovative apparatus aims to enhance the detection of substrate damage in display production. It comprises a drive unit, support rods, sensors, and a controller, allowing for vertical damage inspection of the substrate in motion. The design emphasizes simplicity and ease of operation, underscoring its practical utility.

Career Highlights

Throughout his career, Guangzhi Li has made significant strides in the technology sector. He has worked with notable companies such as BOE Technology Group Co., Ltd. and Hefei BOE Optoelectronics Technology Co., Ltd., contributing to advancements in optoelectronic technologies.

Collaborations

Li has collaborated with prominent professionals like Zhiqiang Wang and Bin Wu, enhancing his projects through teamwork and shared expertise. These collaborations have further strengthened his innovations and facilitated the development of effective inspection technologies.

Conclusion

Guangzhi Li's work in developing the substrate damage inspection apparatus represents a crucial advancement in display technology. His inventions not only contribute to more efficient manufacturing processes but also showcase the importance of innovation in addressing industry challenges. Looking forward, his continued efforts in research and development promise to yield further significant advancements in the field.