Bristol, United Kingdom

Gregor Elliott

USPTO Granted Patents = 1 

 

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Gregor Elliott: Innovator in Semiconductor Metrology

Introduction

Gregor Elliott is a notable inventor based in Bristol, GB. He has made significant contributions to the field of semiconductor technology, particularly in the area of mass metrology. His innovative work has led to the development of a unique apparatus that enhances the precision of semiconductor wafer measurements.

Latest Patents

Gregor Elliott holds a patent for a "Semiconductor wafer mass metrology apparatus and semiconductor wafer mass metrology method." This invention includes a measurement chamber designed to measure the weight and/or mass of a semiconductor wafer. The apparatus features a first temperature changing part that adjusts the temperature of the semiconductor wafer before it is transported into the measurement chamber. Additionally, it incorporates a first temperature sensor that detects the temperature of either the first temperature changing part or the semiconductor wafer itself during the measurement process. He has 1 patent to his name.

Career Highlights

Throughout his career, Gregor has worked with prominent companies in the semiconductor industry. Notably, he has been associated with Lam Research Corporation and Metryx Limited. His experience in these organizations has allowed him to refine his skills and contribute to advancements in semiconductor technology.

Collaborations

Gregor has collaborated with various professionals in his field, including his coworker Eric Tonnis. Their joint efforts have furthered the development of innovative solutions in semiconductor metrology.

Conclusion

Gregor Elliott's contributions to semiconductor technology through his innovative patent and career experiences highlight his role as a key figure in the industry. His work continues to influence advancements in semiconductor wafer measurement techniques.

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