Bonham, TX, United States of America

Greg Gopffarth


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 10(Granted Patents)


Company Filing History:


Years Active: 1993

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Greg Gopffarth

Introduction

Greg Gopffarth is a notable inventor based in Bonham, Texas. He has made significant contributions to the field of semiconductor technology. His work primarily focuses on methods that enhance the performance and reliability of silicon substrates used in electronic components.

Latest Patents

One of Greg Gopffarth's key patents is titled "Backside gettering method employing a monocrystalline germanium-silicon." This patent describes a method for gettering metal atoms from a subsequently contaminated silicon substrate. The process involves depositing a thin germanium-silicon layer on a smoothed or polished first surface, followed by a silicon layer that seals the germanium-silicon layer between the substrate and the silicon layer. This innovative approach addresses contamination issues that arise during the fabrication of electronic components.

Career Highlights

Greg Gopffarth is associated with Texas Instruments Corporation, a leading company in the semiconductor industry. His work has contributed to advancements in the manufacturing processes of electronic devices. With a patent portfolio that includes 1 patent, Gopffarth has established himself as a valuable asset in his field.

Collaborations

Throughout his career, Greg has collaborated with esteemed colleagues such as Keith J Lindberg and Jerry D Smith. These partnerships have fostered innovation and have led to the development of cutting-edge technologies in semiconductor manufacturing.

Conclusion

Greg Gopffarth's contributions to the field of semiconductor technology exemplify the impact of innovative thinking in electronics. His patented methods continue to influence the industry, ensuring the reliability and performance of electronic components.

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