Glen E Leinbach

Title: Glen E Leinbach: Innovator in Test Probe Access Structures

Introduction

Glen E Leinbach is a notable inventor based in Fort Collins, CO (US). He has made significant contributions to the field of electronics, particularly in the area of test probe access structures. With a total of 3 patents to his name, Leinbach's work has advanced the capabilities of printed circuit assemblies.

Latest Patents

Leinbach's latest patents include a method and apparatus for manufacturing and probing test probe access structures on vias. This innovation presents one or more test probe access structures that are conductively connected to a via at a test probe access location above an exposed surface of the via, making it accessible for probing by a test probe. Another significant patent is for printed circuit board test access point structures, which details a test access point structure for accessing test points of a printed circuit board. This method utilizes the z-dimension in an x-, y-, z-coordinate system to implement test access point structures, ensuring that each structure is conductively connected to a trace for electrical probing by an external device.

Career Highlights

Glen E Leinbach is currently employed at Agilent Technologies, Inc., where he continues to innovate and develop new technologies. His work has been instrumental in enhancing the efficiency and effectiveness of electronic testing processes.

Collaborations

Throughout his career, Leinbach has collaborated with notable colleagues, including Kenneth Paul Parker and Ronald J Peiffer. These collaborations have contributed to the advancement of technology in their respective fields.

Conclusion

Glen E Leinbach's contributions to the field of electronics through his patents and work at Agilent Technologies, Inc. highlight his role as an influential inventor. His innovations in test probe access structures have paved the way for improved electronic testing methodologies.