Company Filing History:
Years Active: 1996-2002
Title: Gideon Rosenfeld: Innovator in Microscopic Inspection Technologies
Introduction
Gideon Rosenfeld is a prominent inventor based in Tel Aviv, Israel. He has made significant contributions to the field of microscopic inspection technologies, holding a total of 3 patents. His work focuses on developing advanced systems for defect detection in various patterned objects.
Latest Patents
Rosenfeld's latest patents include innovative methods and apparatuses for inspecting articles. One notable patent is an "Apparatus and method for microscopic inspection of articles," which features a defect detection system designed to inspect objects such as reticles, photomasks, semiconductor wafers, and flat panel displays. This system operates in two stages, examining objects for fine defects using a binary level representation and for ultra-fine defects using a gray level representation. Additionally, it includes re-inspection apparatus to reduce false alarm rates and classify remaining defects by size, area, and type. Another significant patent is the "Apparatus and method for inspection of a patterned object by comparison," which outlines a method for inspecting a patterned object and comparing it with a reference. This method involves providing a patterned object, inspecting it, and comparing its visual characteristics with those of a reference object.
Career Highlights
Throughout his career, Gideon Rosenfeld has worked with notable companies in the industry, including Orbot Instruments Ltd. and Applied Materials, Inc. His experience in these organizations has allowed him to refine his skills and contribute to the advancement of inspection technologies.
Collaborations
Rosenfeld has collaborated with several professionals in his field, including Meir Aloni and Amir Alon. These collaborations have further enhanced his innovative capabilities and contributed to the development of his patented technologies.
Conclusion
Gideon Rosenfeld is a distinguished inventor whose work in microscopic inspection technologies has led to significant advancements in defect detection systems. His contributions continue to impact various industries, showcasing the importance of innovation in technology.