Van Austyne, TX, United States of America

George C Epp


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 23(Granted Patents)


Company Filing History:


Years Active: 2001

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1 patent (USPTO):Explore Patents

Title: Innovations of George C. Epp

Introduction

George C. Epp is an accomplished inventor based in Van Austyne, TX (US). He has made significant contributions to the field of optical inspection technology. His innovative approach has led to the development of a unique system for inspecting surface structures on various objects, particularly semiconductor wafers.

Latest Patents

George C. Epp holds a patent for a "System and method of optically inspecting surface structures on an object." This invention involves a platform that supports the object under examination, equipped with lights or energy sources for optimal illumination. The system utilizes opposing lateral energy sources to direct energy at a low angle along the object's surface, combined with a coaxial light source that emits energy downward. The reflected energy is captured as an image by a CCD camera, allowing for detailed analysis and defect categorization.

Career Highlights

Epp's career is marked by his dedication to advancing optical inspection methods. His work has been instrumental in enhancing the accuracy and efficiency of surface inspections in various industries. He is currently associated with Isoa, Inc., where he continues to innovate and develop cutting-edge technologies.

Collaborations

George C. Epp has collaborated with notable colleagues, including Youling Lin and Charles Harris. Their combined expertise has contributed to the success of various projects and advancements in optical inspection technology.

Conclusion

George C. Epp's contributions to the field of optical inspection are noteworthy. His innovative patent and collaborative efforts reflect his commitment to advancing technology in this area. His work continues to impact the industry positively.

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