Company Filing History:
Years Active: 2004-2015
Title: Gensuke Hoshino: Innovator in Particle Image Velocimetry
Introduction
Gensuke Hoshino is a notable inventor based in Wako, Japan. He has made significant contributions to the field of particle image velocimetry, holding a total of 4 patents. His work focuses on enhancing the precision of flow measurement techniques, which are crucial in various engineering applications.
Latest Patents
Hoshino's latest patents include innovative methods and systems in particle image velocimetry. These patents are:
1. Particle image velocimetry method.
2. Particle image velocimetry method for 3-dimensional space.
3. Particle image velocimetry system.
4. Tracer particle generating device in particle image velocimetry system.
The particle image velocimetry system he developed supplies tracer particles to a flow field around an object. It captures images of reflected light by irradiating the tracer particles with laser light at different times. The system determines a velocity vector of the flow field based on the two images obtained. By analyzing the cross-correlation values of the luminance patterns of the tracer particles, the system can reliably determine erroneous vectors, thus enhancing measurement precision.
Career Highlights
Hoshino has worked with prominent companies in the automotive industry, including Honda Giken Kogyo Kabushiki Kaisha and Honda Motor Co., Ltd. His experience in these organizations has allowed him to apply his innovative ideas in practical settings, contributing to advancements in engineering and technology.
Collaborations
Throughout his career, Hoshino has collaborated with talented individuals such as Minoru Teramura and Junji Takado. These collaborations have fostered a creative environment that has led to the development of groundbreaking technologies.
Conclusion
Gensuke Hoshino is a distinguished inventor whose work in particle image velocimetry has significantly impacted the field. His innovative patents and collaborations highlight his commitment to advancing technology and improving measurement techniques.