Houston, TX, United States of America

Geetha Nair

USPTO Granted Patents = 1 

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Geetha Nair: Innovator in Hybrid ESP Failure Prediction

Introduction

Geetha Nair is a prominent inventor based in Houston, TX (US). She has made significant contributions to the field of engineering, particularly in the area of hybrid electrical submersible pump (ESP) failure prediction. Her innovative work utilizes advanced machine learning techniques to enhance the reliability and efficiency of ESP systems.

Latest Patents

Geetha Nair holds a patent for her invention titled "Hybrid ESP failure prediction using fuzzy logic for data improvement and augmentation." This patent describes systems and methods that employ a trained machine learning model to monitor and detect failures within an operating ESP in a well. The process involves collecting ESP status data from sensors, cleaning the data using fuzzy logic, and generating labels that represent various ESP conditions. The trained ML model then uses these features to provide accurate monitoring and failure detection, ultimately scheduling remediation procedures before catastrophic failures occur.

Career Highlights

Geetha Nair is currently employed at Landmark Graphics Corporation, where she continues to develop innovative solutions in the field of engineering. Her work has been instrumental in advancing the technology used in ESP systems, contributing to improved operational efficiency and reduced downtime.

Collaborations

Geetha has collaborated with talented coworkers, including Ailneni Rakshitha Rao and Shashwat Verma, to further enhance her research and development efforts. Their combined expertise has led to significant advancements in the field.

Conclusion

Geetha Nair's contributions to hybrid ESP failure prediction demonstrate her commitment to innovation and excellence in engineering. Her work not only improves the reliability of ESP systems but also showcases the potential of machine learning in industrial applications.

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