Gary P Visco

Title: Gary P. Visco: Innovator in Electronic Circuit Testing

Introduction

Gary P. Visco is a notable inventor based in Hinesburg, Vermont. He has made significant contributions to the field of electronic circuit testing. His innovative approach has led to the development of a unique patent that addresses the challenges of data storage requirements in high-speed testing environments.

Latest Patents

Gary P. Visco holds a patent for an "Apparatus for reducing test data storage requirements for high speed." This invention involves an apparatus that applies a plurality of test cycles data, specifying various test conditions to a multiple pin electronic circuit. The patent describes a random access memory that includes complete data fields for multiple test cycles at higher order addresses. Some of these data fields contain operational codes that indicate changes in a minority of data bits during consecutive test cycles. The invention enhances efficiency by allowing the hold register to receive addressed rows of test data without altering the majority of data bits.

Career Highlights

Gary P. Visco is associated with the International Business Machines Corporation, commonly known as IBM. His work at IBM has allowed him to explore and develop innovative solutions in electronic testing. His contributions have been instrumental in advancing the capabilities of electronic circuits.

Collaborations

Throughout his career, Gary has collaborated with esteemed colleagues such as Ernest H. Millham and John J. Moser, Jr. These collaborations have fostered an environment of innovation and have contributed to the success of his projects.

Conclusion

In summary, Gary P. Visco is a distinguished inventor whose work in electronic circuit testing has led to significant advancements in the field. His patent reflects a deep understanding of the complexities involved in high-speed testing, showcasing his innovative spirit and dedication to improving technology.