Company Filing History:
Years Active: 1989-1992
Title: Innovations of Fritz J Hohn
Introduction
Fritz J Hohn is a notable inventor based in Somers, NY (US). He has made significant contributions to the field of technology, holding a total of 5 patents. His work primarily focuses on advancements in X-ray mask technology and E-beam testing systems.
Latest Patents
One of his latest patents is an X-ray mask containing a cantilevered tip for gap control and alignment. This invention discusses an X-ray mask membrane where a cantilever and tip portion, similar to those used in atomic force or scanning tunneling microscopes, are fabricated directly as part of the mask. The mask is positioned over a wafer, and the vertical motion of the tip is achieved using a piezoelectric device mounted on a movable support above the cantilever. The piezoelectric device allows for precise alignment of the cantilever tip with the wafer.
Another significant patent involves a method for opens/shorts testing of capacitively coupled networks. This E-beam testing system utilizes an electron beam to test samples with conductive elements. The system charges these elements and employs a series of grids to control the emission of secondary electrons. This innovative method allows for testing electrical connections and short circuits without physical contact, enhancing the efficiency of electronic testing.
Career Highlights
Fritz J Hohn is associated with International Business Machines Corporation (IBM), where he has contributed to various technological advancements. His expertise in the field has led to the development of innovative solutions that address complex challenges in electronic testing and alignment.
Collaborations
Fritz has collaborated with notable coworkers such as Steven D Golladay and David J Hutson, further enhancing the impact of his inventions through teamwork and shared expertise.
Conclusion
Fritz J Hohn's contributions to technology through his patents and collaborations highlight his role as an influential inventor. His work continues to shape advancements in electronic testing and alignment technologies.