Fred R Reich

Title: Fred R. Reich: Innovator in Optical Measurement Technology

Introduction

Fred R. Reich is a notable inventor based in Richland, WA (US). He has made significant contributions to the field of optical measurement technology. His innovative work has led to the development of a unique optical extensometer, which is designed to measure the dimensions of objects without physical contact.

Latest Patents

Fred R. Reich holds a patent for an optical extensometer. This device utilizes sequentially pulsed light beams to detect the dimensions of objects by identifying two opposite edges. The light beams can have different characteristics, such as polarization or wavelength, and are modulated in an alternating manner at a reference frequency. This technology allows for precise measurements by comparing the readout signal from a photoelectric detector with a reference signal.

Career Highlights

Reich's career is marked by his work at the Battelle Memorial Institute, where he has been able to apply his innovative ideas in a collaborative environment. His patent for the optical extensometer showcases his ability to merge theoretical concepts with practical applications, enhancing measurement techniques in various industries.

Collaborations

Throughout his career, Fred R. Reich has collaborated with notable colleagues, including Ray A. Walker and James T. Russell. These partnerships have contributed to the advancement of technology in optical measurement and have fostered a culture of innovation within their field.

Conclusion

Fred R. Reich's contributions to optical measurement technology through his patent for the optical extensometer exemplify his innovative spirit and dedication to advancing measurement techniques. His work continues to influence the industry and inspire future innovations.