Frank Jyh-Herng Shih

Title: **Innovator Spotlight: Frank Jyh-Herng Shih**

Introduction

Frank Jyh-Herng Shih is a notable inventor based in Los Angeles, California. With a strong focus on precision measurement technologies, he has contributed to the field of glass thickness measurement through his innovative patent.

Latest Patents

Shih's most significant patent is titled **Laser-based Glass Thickness Measurement System and Method**. This invention utilizes a laser-based technique to accurately determine the thickness of glass. By employing a pulsed laser, Shih's method induces ultrasonic waves within the glass, allowing for the measurement of surface motion at a characteristic frequency. This frequency is directly proportional to the glass thickness, enabling a high level of precision in measurement. The technology represents a significant advancement in the field, offering a non-invasive method to assess glass quality.

Career Highlights

Throughout his career, Frank Jyh-Herng Shih has demonstrated a commitment to innovation and excellence in technological advancement. His contributions to the field have garnered recognition for the effective use of laser technology in material science, particularly in glass measurement applications.

Collaborations

In his pursuit of innovation, Shih has collaborated with distinguished colleagues, including Andrew D. W. McKie and Marvin E. Klein. These partnerships have facilitated the exchange of ideas and contributed to the successful development and implementation of his research.

Conclusion

Frank Jyh-Herng Shih stands out as an inventor who merges creativity with technical expertise. His development of a laser-based glass thickness measurement system showcases not only his talent but also his dedication to advancing technology in practical applications. His work continues to inspire fellow inventors and researchers in the industry.