Fall City, WA, United States of America

Frank J Schumacher Iv


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 32(Granted Patents)


Company Filing History:


Years Active: 2005

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1 patent (USPTO):Explore Patents

Title: Frank J Schumacher IV: Innovator in Charged Particle Detection

Introduction

Frank J Schumacher IV is an accomplished inventor based in Fall City, WA (US). He has made significant contributions to the field of charged particle detection, showcasing his expertise through innovative patent developments. His work is particularly notable for its application in advanced detection systems.

Latest Patents

Frank J Schumacher IV holds a patent for a "Charged Particle Beam Detection System." This system features a Faraday cup detector array (FCDA) designed for position-sensitive charged particle beam detection. The FCDA is integrated with an electronic multiplexing unit (MUX) that facilitates the collection and integration of charge deposited in the array while allowing simultaneous readout. The system boasts a duty cycle for ion collection exceeding 98%. The innovative design employs numerous small, electronically decoupled Faraday cups, enabling each cup to function as both a collector and an integrator. This integration results in a highly efficient position-sensitive charged particle detector, capable of measuring absolute ion currents with a wide dynamic range from 1.7 pA to 1.2 µA and a crosstalk of less than 750:1.

Career Highlights

Frank J Schumacher IV is affiliated with the University of Washington, where he continues to advance research in particle detection technologies. His work has garnered attention for its practical applications in various scientific fields.

Collaborations

Throughout his career, Frank has collaborated with notable colleagues, including Robert Bruce Darling and Adi A Scheidemann. These partnerships have contributed to the development and refinement of his innovative detection systems.

Conclusion

Frank J Schumacher IV exemplifies the spirit of innovation in the field of charged particle detection. His contributions through patents and collaborations continue to influence advancements in this critical area of research.

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