Location History:
- Baziege, FR (2008)
- Santa Clara, CA (US) (2009)
Company Filing History:
Years Active: 2008-2009
Title: The Innovations of Félix Beaudoin
Introduction
Félix Beaudoin is a notable inventor based in Santa Clara, California. He has made significant contributions to the field of integrated circuits and magnetic field measurement. With a total of two patents to his name, Beaudoin's work showcases his expertise and innovative spirit.
Latest Patents
One of Beaudoin's latest patents is a method and installation for analyzing an integrated circuit. This method involves applying laser radiation to various surface points of the integrated circuit, exciting the circuit, and collecting the response to the excitation. It calculates the propagation time between the excitation and response-collecting time, ultimately creating an image of the integrated circuit that represents the propagation time at each point of laser radiation application. Another significant patent is a magnetic-field-measuring probe. This probe includes at least one magnetoresistive or magnetoinductive sensor sensitive to the magnetic field along a specific measurement axis. It features two sensors that are rigidly connected, with their measurement axes parallel and offset, allowing for precise magnetic field measurements.
Career Highlights
Félix Beaudoin is currently associated with the Centre National d'Études Spatiales, where he continues to push the boundaries of technology and innovation. His work has been instrumental in advancing the understanding and capabilities of integrated circuits and magnetic field measurement.
Collaborations
Beaudoin has collaborated with talented individuals such as Romain Desplats and Olivier Crepel, contributing to a dynamic and innovative work environment.
Conclusion
Félix Beaudoin's contributions to the fields of integrated circuits and magnetic field measurement highlight his innovative approach and dedication to advancing technology. His patents reflect a commitment to excellence and a vision for the future of electronic measurement.