Company Filing History:
1 out of 4,812 
1 out of 1 Years Active: 2006
Title: Ferenc Riesz: Innovator in Semiconductor Measurement Technology
Introduction
Ferenc Riesz is a notable inventor based in Szentendre, Hungary. He has made significant contributions to the field of semiconductor technology, particularly in the area of non-contact topographic investigation of surfaces. His innovative approach has led to the development of a unique apparatus that enhances measurement accuracy and efficiency.
Latest Patents
Ferenc Riesz holds a patent for an "Apparatus and measurement procedure for the fast, quantitative, non-contact topographic investigation of semiconductor wafers and other mirror-like surfaces." This apparatus includes a light source and a collimating concave mirror designed to produce a parallel beam directed at the sample being investigated. A structured mask is positioned between the light source and the concave mirror, while an image sensor captures the beam reflected from the sample. The relative positions of these components are meticulously arranged to ensure a sharp image of the mask on the sensor. This invention is pivotal for advancing measurement techniques in semiconductor research.
Career Highlights
Throughout his career, Ferenc Riesz has worked with esteemed organizations such as the Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. and the Hungarian Academy of Sciences Research Institute for Technical Physics and Materials Science. His work in these institutions has allowed him to refine his expertise and contribute to groundbreaking research in his field.
Collaborations
Ferenc has collaborated with notable colleagues, including István Endre Lukács and János Makai. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.
Conclusion
Ferenc Riesz's contributions to semiconductor measurement technology exemplify the impact of innovative thinking in scientific research. His patented apparatus represents a significant advancement in the field, showcasing his dedication to enhancing measurement techniques.