Fengya Chen

Title: Innovations by Fengya Chen in Capacitor Testing Technology.

Introduction

Fengya Chen is a notable inventor based in Jiangsu, China. He has made significant contributions to the field of capacitor testing technology. His innovative approach has led to the development of a unique testing device that enhances the efficiency and accuracy of capacitor evaluations.

Latest Patents

Fengya Chen holds a patent for a "Capacitor testing device and testing method thereof." This device includes a carrier with multiple clamping holes designed to hold capacitors during testing. It features a conveying mechanism to transport the carrier, along with an image collection assembly positioned above and below the conveying means. This assembly is responsible for performing defect testing on the outer surfaces of the capacitors. Additionally, the device incorporates a performance testing means, which includes a performance testing circuit board and a lifting assembly that allows for the adjustment of the circuit board's position to test the electrical performance of the capacitors.

Career Highlights

Fengya Chen is associated with Suzhou Apparatus Science Academy Co., Ltd., where he continues to innovate in the field of testing technologies. His work has been instrumental in advancing the methods used for evaluating capacitors, ensuring higher standards of quality and reliability in electronic components.

Collaborations

Fengya Chen collaborates with talented individuals such as Delin Hu and Chun Hu. Their combined expertise contributes to the ongoing development of innovative solutions in the field of apparatus science.

Conclusion

Fengya Chen's contributions to capacitor testing technology exemplify the impact of innovation in enhancing electronic component evaluation. His patented device represents a significant advancement in the industry, showcasing his dedication to improving testing methodologies.