Company Filing History:
Years Active: 2017
Title: Etsuo Arakawa: Innovator in Scattering Intensity Measurement
Introduction
Etsuo Arakawa is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of measurement technology, particularly in the area of scattering intensity distribution.
Latest Patents
Etsuo Arakawa holds a patent for a "Method and apparatus for measuring scattering intensity distribution." This invention aims to provide a method and apparatus capable of measuring scattering intensity distribution in reciprocal space efficiently. The technology involves the use of X-rays emitted from a source, which are reflected by an optical element to converge near a sample's surface. The method allows for the detection of scattering intensities using a two-dimensional detector, enabling the calculation of scattering intensity distribution based on the detected data.
Career Highlights
Etsuo Arakawa is affiliated with the Inter-university Research Institute Corporation High Energy Accelerator Research Organization. His work has been instrumental in advancing measurement techniques in scientific research.
Collaborations
Etsuo has collaborated with notable colleagues, including Tadashi Matsushita and Wolfgang Voegeli, contributing to various research projects and innovations.
Conclusion
Etsuo Arakawa's innovative work in scattering intensity measurement showcases his expertise and dedication to advancing technology in his field. His contributions continue to impact scientific research and measurement methodologies.