Company Filing History:
Years Active: 2021
Title: The Innovations of Etienne DeForas
Introduction
Etienne DeForas is a notable inventor based in Saint Nazaire les Eymes, France. He has made significant contributions to the field of technology, particularly in the area of sensor evaluation and contamination detection. With a total of 2 patents, his work has garnered attention for its innovative approaches.
Latest Patents
DeForas's latest patents include a method for darkfield contamination detection and a method for darkfield modeling. The darkfield contamination detection patent outlines a process for evaluating a darkfield image to determine if an object is interacting with a fingerprint sensor. If the object is not interacting, a darkfield candidate image is captured and evaluated for contamination. The results of this evaluation help ascertain whether the image contains any contamination. The darkfield modeling patent describes a method for modeling a darkfield candidate image at a sensor by capturing multiple darkfield images under different operational conditions. This method allows for the creation of a darkfield candidate image that combines these images based on the sensor's operational condition.
Career Highlights
Etienne DeForas is currently employed at Invensense, Inc., where he continues to develop innovative technologies. His work focuses on enhancing sensor capabilities and improving contamination detection methods. His contributions have been instrumental in advancing the field of sensor technology.
Collaborations
DeForas has collaborated with notable colleagues such as Bruno Flament and Daniela Hall. These partnerships have fostered a creative environment that encourages innovation and the development of cutting-edge technologies.
Conclusion
Etienne DeForas is a distinguished inventor whose work in sensor technology and contamination detection has made a significant impact. His patents reflect a commitment to innovation and excellence in his field.