Waterford, MI, United States of America

Eric M Walstra


Average Co-Inventor Count = 1.3

ph-index = 2

Forward Citations = 48(Granted Patents)


Location History:

  • Clarkston, MI (US) (2010)
  • Waterford, MI (US) (2013)

Company Filing History:


Years Active: 2010-2013

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2 patents (USPTO):Explore Patents

Title: Innovator Eric M. Walstra: Pioneering Optical Inspection Methods

Introduction

Eric M. Walstra, based in Waterford, MI, has made significant contributions to the field of optical inspection through his inventive methodologies. With a total of two patents to his name, Walstra is known for developing innovative systems that enhance precision in manufacturing processes. His work is instrumental in improving the quality control of parts through advanced measurement techniques.

Latest Patents

Eric M. Walstra's latest patents include a "Method and System for Optically Inspecting Parts" and a "Method for Precisely Measuring Position of a Part to Be Inspected at a Part Inspection Station."

The "Method and System for Optically Inspecting Parts" details an apparatus that linearly scans a radiation plane, wider than the diameter of a part, to analyze the exterior surface of said part. This innovation facilitates the formulation of a virtual representation of the outer profile of the part and its interference position with a physical gauge, providing an efficient means to calculate essential measurements.

His second patent, the "Method for Precisely Measuring Position of a Part to Be Inspected at a Part Inspection Station," focuses on the accurate positioning of parts for inspection. It utilizes an array of planes of radiation to analyze each part's geometric dimensions. The feedback mechanism allows for adjustments in position until the measurements fall within acceptable ranges, ensuring high standards of quality assurance in production processes.

Career Highlights

Eric M. Walstra is affiliated with Gii Acquisition, LLC, where he continues to refine his expertise in optical inspection and measurement technologies. His innovative approach not only enhances operational efficiencies but also fosters reliability in the manufacturing sector.

Collaborations

Walstra works alongside John D. Spalding, collaborating on various projects that push the boundaries of optical inspection technology. Their combined efforts are pivotal in driving advancements in the field, contributing to both academic knowledge and practical applications.

Conclusion

Through his pioneering patents and dedication to optical inspection methodologies, Eric M. Walstra exemplifies the spirit of innovation. His work significantly impacts the landscape of precision measurement in manufacturing, showcasing the essential role of inventors in advancing industry standards.

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