Company Filing History:
Years Active: 1985-1989
Title: The Innovations of Eric Lindbloom
Introduction
Eric Lindbloom is a notable inventor based in Poughkeepsie, NY (US). He has made significant contributions to the field of integrated circuit testing, holding a total of 4 patents. His work primarily focuses on enhancing the efficiency and accuracy of testing very large scale integrated circuit devices.
Latest Patents
One of Eric's latest patents is the "Weighted Random Pattern Testing Apparatus and Method." This invention provides a method and apparatus for testing Level Sensitive Scan Design (LSSD) devices. It involves applying differently configured sequences of pseudo-random patterns in parallel to each input terminal of the device under test. The outputs from each terminal are collected in parallel, combined to obtain a signature, and compared with a known good signature obtained through computer simulation. The input test stimuli are further adjusted based on the device's structure, allowing for individual weighting of inputs to favor more or less binary ones or zeros.
Career Highlights
Eric Lindbloom is currently employed at International Business Machines Corporation, commonly known as IBM. His work at IBM has allowed him to develop innovative solutions that address complex challenges in integrated circuit testing.
Collaborations
Throughout his career, Eric has collaborated with notable colleagues, including Edward B. Eichelberger and Franco Motika. These collaborations have contributed to the advancement of technology in the field of integrated circuits.
Conclusion
Eric Lindbloom's contributions to the field of integrated circuit testing through his patents and work at IBM highlight his innovative spirit and dedication to advancing technology. His inventions continue to influence the industry and improve testing methodologies.