Eric Giguère

Title: Eric Giguère: Innovator in Integrated Circuit Testing

Introduction

Eric Giguère is a notable inventor based in Granby, CA. He has made significant contributions to the field of integrated circuit testing, particularly through his innovative patent. His work is recognized for its impact on the efficiency and effectiveness of electronic components.

Latest Patents

Eric Giguère holds a patent for "Techniques and structures for testing integrated circuits in flip-chip assemblies." This patent describes a method for rejoining an integrated circuit (IC) die, which has been removed from an existing substrate, to a new substrate. The method involves grinding the existing substrate to create a planar surface that exposes interconnects and surrounding underfill material. A new substrate with electrically conductive pedestals is then aligned with the exposed interconnects. The process includes applying a reflow technique to melt and electrically join the interconnects with the pedestals, enhancing the reliability of the connections.

Career Highlights

Eric Giguère is associated with International Business Machines Corporation (IBM), where he has contributed to various projects and innovations. His expertise in integrated circuits has positioned him as a valuable asset in the technology sector.

Collaborations

Some of his notable coworkers include Michel Deschenes and Marco Gauvin. Their collaborative efforts have further advanced the research and development of integrated circuit technologies.

Conclusion

Eric Giguère's contributions to integrated circuit testing through his innovative patent demonstrate his commitment to advancing technology. His work continues to influence the field and improve electronic component reliability.