Jena, Germany

Eric Günl

This inventor holds 1 USPTO granted patent. Top assignee: Sioptica Gmbh. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Eric Günl. Retrieved from https://idiyas.com/inventor/eric-günl

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2024

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Eric Günl - Innovator in Non-Destructive Inspection Methods

Introduction

Eric Günl is a notable inventor based in Jena, Germany. He has made significant contributions to the field of non-destructive inspection methods. His innovative approach has led to the development of a unique patent that enhances the inspection of surface structures.

Latest Patents

Eric Günl holds a patent for a method and assembly for non-destructively inspecting a surface structure. This method involves preparing the surface structure and wetting a portion of it with a liquid. The variation in the thickness of the liquid is controlled to form a light guide that mirrors the inverse shape of the surface structure. Light is coupled into this light guide, allowing for the capture and evaluation of images, which aids in the inspection process.

Career Highlights

Eric is currently associated with Sioptica GmbH, where he applies his expertise in developing advanced inspection technologies. His work has been instrumental in improving the efficiency and accuracy of surface inspections in various applications.

Collaborations

Eric collaborates with talented individuals such as Markus Klippstein and André Heber. Their combined efforts contribute to the innovative projects at Sioptica GmbH.

Conclusion

Eric Günl's contributions to non-destructive inspection methods exemplify the impact of innovation in technology. His patent reflects a significant advancement in the field, showcasing his dedication to improving inspection techniques.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…