Mito, Japan

Emiko Murofushi

This inventor holds 1 USPTO granted patent. Top assignee: Hitachi, Ltd.. Active years: 1991.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Emiko Murofushi. Retrieved from https://idiyas.com/inventor/emiko-murofushi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 13(Granted Patents)


Company Filing History:


Years Active: 1991

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1 patent (USPTO):Explore Patents

Title: Emiko Murofushi: Innovator in Semiconductor Technology

Introduction

Emiko Murofushi is a prominent inventor based in Mito, Japan. She has made significant contributions to the field of semiconductor technology. Her innovative work has led to the development of a unique semiconductor device that enhances performance and reliability.

Latest Patents

Murofushi holds 1 patent for a semiconductor device. This invention features a metallization film layer made of a copper (Cu) alloy. The alloy contains a metal element that is less noble than copper, which improves corrosion resistance while maintaining high electrical conductivity, heat resistance, and electro-migration resistance.

Career Highlights

Emiko Murofushi has built a successful career at Hitachi, Ltd. Her work has been instrumental in advancing semiconductor technologies. She is recognized for her innovative approach and dedication to research and development in this critical field.

Collaborations

Murofushi has collaborated with notable colleagues, including Shiro Kobayashi and Masahiko Itoh. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

Emiko Murofushi is a trailblazer in semiconductor technology, with her patent reflecting her commitment to innovation. Her contributions continue to influence the industry and inspire future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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