Madison, AL, United States of America

Elaine S Acree




Average Co-Inventor Count = 1.2

ph-index = 2

Forward Citations = 19(Granted Patents)


Company Filing History:


Years Active: 2012-2016

Loading Chart...
Loading Chart...
Loading Chart...
4 patents (USPTO):Explore Patents

Title: Elaine S Acree: Innovator in Shadow Estimation and Aerial Surveys

Introduction

Elaine S Acree is a notable inventor based in Madison, AL (US), recognized for her contributions to the fields of image processing and aerial surveying. With a total of 4 patents, her work has significantly advanced the methodologies used in these areas.

Latest Patents

One of her latest patents is titled "Method and apparatus for shadow estimation and spreading." This innovative computer-implemented method creates an image that depicts shadowing for a specified light source, even when the input data is limited to elevation data. The method generates plumb line walls between elevation points of neighboring grid cells, allowing for the accumulation of a shadow map based on pixel visibility to the light source. This results in an image that accurately represents visibility features. Another significant patent is the "Method and apparatus of taking aerial surveys." This method maps boundaries between images from different planes to determine the output image's boundaries, enhancing the accuracy of aerial surveys.

Career Highlights

Elaine has worked with prominent companies such as Intergraph Software Technologies Company, where she applied her expertise in developing innovative solutions. Her career reflects a commitment to advancing technology in her field.

Collaborations

Throughout her career, Elaine has collaborated with talented individuals, including Sheila G Whitaker and Gene Arthur Grindstaff. These partnerships have contributed to her success and the development of her patents.

Conclusion

Elaine S Acree's innovative work in shadow estimation and aerial surveys showcases her significant contributions to technology. Her patents reflect a deep understanding of complex methodologies that enhance image processing and surveying techniques.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…