Company Filing History:
Years Active: 2019-2020
Title: Eisuke Shiina - Innovator in Inspection Technology
Introduction
Eisuke Shiina is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of inspection technology, holding 2 patents that enhance the efficiency and accuracy of flaw detection systems.
Latest Patents
His latest patents include an innovative inspection system and an advanced inspection probe. The inspection system features a sheet material attached to a pipe's surface, with two-dimensional patterns that indicate positions on the pipe. A reader mounted to an ultrasonic probe reads these patterns, while a calculation unit acquires position data based on the patterns read. This system effectively associates position data with flaw detection results obtained from the ultrasonic probe. The inspection probe, on the other hand, is designed to be freely movable on a test object. It irradiates the object with ultrasonic waves to detect reflected waves. The probe includes a chassis that moves on a sheet material with a two-dimensional pattern, ensuring that the ultrasonic wave's incident point is within the reader's angle of view.
Career Highlights
Eisuke Shiina is currently employed at IHI Corporation, where he continues to develop innovative solutions in inspection technology. His work has significantly impacted the industry, providing tools that enhance the reliability of flaw detection processes.
Collaborations
He collaborates with talented coworkers, including Toshiaki Hamano and Takuya Shimomura, contributing to the advancement of their projects and innovations.
Conclusion
Eisuke Shiina's contributions to inspection technology through his patents and work at IHI Corporation highlight his role as a key innovator in the field. His inventions are paving the way for more efficient and accurate inspection systems.