Company Filing History:
Years Active: 2023
Title: Eilon Sherman: Innovator in Fret Microscopy
Introduction
Eilon Sherman is a notable inventor based in Mevaseret-Zion, Israel. He has made significant contributions to the field of microscopy, particularly through his innovative patent related to fret microscopy.
Latest Patents
Eilon Sherman holds one patent titled "System and method for use in fret microscopy." This patent presents a system and method for monitoring and imaging a sample. The system includes a light unit designed to illuminate the sample in at least two different wavelength ranges. Additionally, it features a collection unit that collects light emitted from the sample in at least a third wavelength range and directs this light towards at least one detector. An activation unit is also included, which provides an activation signal to selectively activate a portion of the fluorescent substance in the sample. Furthermore, the processing circuitry operates the light unit to determine a selected temporal illumination profile of the different wavelength ranges and controls the activation unit for controllable activation.
Career Highlights
Eilon Sherman is associated with Yissum Research Development Company of the Hebrew University of Jerusalem Ltd. His work at this esteemed institution has allowed him to explore and develop advanced technologies in microscopy.
Collaborations
Eilon collaborates with Shai Tsipshtein, a talented woman in the field, contributing to the advancement of their research and innovations.
Conclusion
Eilon Sherman is a prominent inventor whose work in fret microscopy showcases his dedication to advancing scientific research. His innovative patent reflects his expertise and commitment to developing new technologies.