Company Filing History:
Years Active: 1995-1996
Title: Eiji Takane: Innovator in Alignment Methods and Measurement Techniques
Introduction
Eiji Takane is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of alignment methods and measurement techniques, holding a total of 3 patents. His work has been instrumental in advancing technologies used in various industries.
Latest Patents
One of Eiji Takane's latest patents is an "Alignment method and alignment apparatus with a statistic calculation." This invention discloses a method for aligning multiple processing areas on a substrate according to designed alignment coordinates. It involves measuring the coordinate positions of specific processing areas and determining the positions of all processing areas by executing a statistical calculation based on weighted coordinates.
Another notable patent is the "Method of measuring a leveling plane." This method allows for the rapid and accurate measurement of the inclination of a leveling plane without the need for a special super-flat wafer. By exposing images of focus measuring marks in overlapping shot areas, the best focal position is determined using an average of the mark lengths.
Career Highlights
Eiji Takane has worked with renowned companies, including Nikon Corporation. His experience in these organizations has allowed him to develop and refine his innovative techniques in alignment and measurement.
Collaborations
Throughout his career, Eiji has collaborated with notable coworkers such as Shigeru Hirukawa and Nobuyuki Irie. These partnerships have contributed to the success of his inventions and advancements in technology.
Conclusion
Eiji Takane's contributions to alignment methods and measurement techniques have made a significant impact in his field. His innovative patents and collaborations with industry professionals highlight his dedication to advancing technology.