Ft. Collins, CO, United States of America

Edward Steketee


Average Co-Inventor Count = 1.7

ph-index = 3

Forward Citations = 63(Granted Patents)


Location History:

  • Fort Collins, CO (US) (1991 - 2002)
  • Ft. Collins, CO (US) (1998 - 2004)

Company Filing History:


Years Active: 1991-2004

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7 patents (USPTO):Explore Patents

Title: Edward Steketee: Innovator in Optical Technology

Introduction

Edward Steketee is a notable inventor based in Ft. Collins, CO (US). He has made significant contributions to the field of optical technology, holding a total of 7 patents. His work focuses on precision measurement and detection, showcasing his expertise in innovative solutions.

Latest Patents

One of Steketee's latest inventions is the sub-micron accuracy edge detector. This edge detector utilizes two single-mode optical fibers connected by an optical path. One fiber is linked to a laser light source, generating a light beam, while the other fiber connects to an optical power detector. The optical power reaching the detector is influenced by the extent to which the light beam is obscured by an object. Consequently, the position of the object's edge can be determined based on the optical power measured by the detector. This technology allows for automatic positioning of the object's edge according to the optical power detected.

Career Highlights

Throughout his career, Edward Steketee has worked with prominent companies such as Agilent Technologies, Inc. and Hewlett-Packard Company. His experience in these organizations has contributed to his development as an inventor and innovator in the optical technology sector.

Collaborations

Some of his notable coworkers include John Bernard Medberry and David Hwang. Their collaboration has likely fostered an environment of innovation and creativity in their respective projects.

Conclusion

Edward Steketee's contributions to optical technology through his patents and collaborations highlight his role as a significant inventor in the field. His work continues to influence advancements in precision measurement and detection.

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