Edward J Mettler

Title: The Innovations of Edward J Mettler

Introduction

Edward J Mettler is an accomplished inventor based in International Falls, MN (US). He has made significant contributions to the field of paper quality assessment through his innovative methods and apparatus. His work focuses on identifying out-of-plane defects in paper samples, which is crucial for ensuring the quality of paper products.

Latest Patents

Mettler holds a patent for a "Method and apparatus for determining out-of-plane defects in a paper sample." This patent describes a method that includes providing a paper sample, illuminating it with light, and determining light scattering at various measuring regions. The process involves calculating a standard deviation of light scattering for different bands and averaging these values to assess the out-of-plane defect. An alternative embodiment of the method allows for the assignment of measuring regions to columns of the sample, enabling the calculation of median defect values.

Career Highlights

Mettler's career is marked by his role at Boise White Paper, L.L.C., where he applies his expertise in paper technology. His innovative approach has led to advancements in the quality control processes within the paper industry. His patent reflects his commitment to improving product standards and enhancing manufacturing techniques.

Collaborations

Mettler has collaborated with notable colleagues such as Kevin S Rucker and Guy W Leolich. These partnerships have contributed to the development of his patented technology and have fostered a collaborative environment for innovation in the paper industry.

Conclusion

Edward J Mettler's contributions to the field of paper quality assessment through his innovative patent demonstrate his expertise and commitment to excellence. His work continues to influence the industry and improve product standards.