Company Filing History:
Years Active: 1988
Title: Edrick H Tong: Innovator in Semiconductor Testing Technology
Introduction
Edrick H Tong is a notable inventor based in Sunnyvale, CA, who has made significant contributions to the field of semiconductor technology. His innovative approach to testing coplanarity in semiconductor components has led to the development of a unique patent that enhances the accuracy of integrated circuit surface mount devices.
Latest Patents
Edrick holds a patent for an "Apparatus and method for testing coplanarity of semiconductor components." This invention provides a method and apparatus for measuring the alignment of leads along the perimeter of an integrated circuit surface mount device (SMD). The device is positioned so that a first lead is within the path of a beam of light emitted from a light source. The light source is then moved around the perimeter of the device, allowing the beam of light to contact all of the leads. The angle of reflection of the beam of light off each lead is detected, enabling the determination of lead alignment by calculating a seating plane and the variation of each lead from that plane. Edrick has 1 patent to his name.
Career Highlights
Edrick is currently employed at Santana Engineering Systems, where he continues to innovate and contribute to advancements in semiconductor technology. His work focuses on improving the precision and reliability of semiconductor components, which are critical in various electronic applications.
Collaborations
Edrick has collaborated with several professionals in his field, including Robert L Comstock and Michael R Hansen. These collaborations have fostered a creative environment that encourages the exchange of ideas and the development of cutting-edge technologies.
Conclusion
Edrick H Tong's contributions to semiconductor testing technology exemplify the impact of innovation in the electronics industry. His patent for testing coplanarity in semiconductor components showcases his commitment to enhancing the performance and reliability of electronic devices.