Company Filing History:
Years Active: 1996
Title: The Innovations of Eckehard Kiefer
Introduction
Eckehard Kiefer is a notable inventor based in Grafenau, Germany. He has made significant contributions to the field of optical technology, particularly through his innovative work on micropolarimeters. His inventions have the potential to enhance the characterization of thin films, which is crucial in various scientific and industrial applications.
Latest Patents
Eckehard Kiefer holds a patent for a micropolarimeter, which includes a microsensor system and a method for characterizing thin films. This micropolarimeter consists of an analyzer and a detector, typically a photodetector array, arranged in a circular configuration with multiple sectors. The analyzer assigns different polarization values to these sectors, and both components are designed without any moving parts. The invention proposes three different embodiments for the analyzer, including a glass cone with a polarizing thin film stack, a metal grid polarizing array, and an array of polarizing waveguides. This micropolarimeter is ideally utilized in microellipsometer systems, serving as a valuable tool for film diagnostics and optical characterization of thin films.
Career Highlights
Eckehard Kiefer is associated with the International Business Machines Corporation, commonly known as IBM. His work at IBM has allowed him to focus on advancing optical technologies and contributing to the company's innovative projects. His expertise in the field has positioned him as a key figure in the development of new optical measurement techniques.
Collaborations
Eckehard has collaborated with notable colleagues such as Peter Pokrowsky and Michael Abraham. These collaborations have fostered an environment of innovation and have led to the development of cutting-edge technologies in the field of optics.
Conclusion
Eckehard Kiefer's contributions to the field of optical technology, particularly through his patented micropolarimeter, highlight his role as an influential inventor. His work continues to impact the characterization of thin films, showcasing the importance of innovation in scientific research and industrial applications.